detect_test.h

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/* SPDX-License-Identifier: BSD-3-Clause
 *
 * Copyright(c) 2019 Intel Corporation. All rights reserved.
 *
 * Author: Slawomir Blauciak <slawomir.blauciak@linux.intel.com>
 */
 
#ifndef __USER_DETECT_TEST_H__
#define __USER_DETECT_TEST_H__
 
#include <stdint.h>

#define SOF_DETECT_TEST_CONFIG  0
#define SOF_DETECT_TEST_MODEL   1
 
struct sof_detect_test_config {
    uint32_t size;

    uint32_t load_mips;
    uint32_t load_memory_size;
    uint32_t preamble_time;

    uint16_t activation_shift;

    int16_t sample_width;

    int32_t activation_threshold;

    uint32_t drain_req;

    uint32_t reserved[1];
} __packed;
 
uint16_t test_keyword_get_sample_valid_bytes(struct comp_dev *dev);
 
uint32_t test_keyword_get_detected(struct comp_dev *dev);
void test_keyword_set_detected(struct comp_dev *dev, uint32_t detected);
 
#if CONFIG_KWD_NN_SAMPLE_KEYPHRASE
const int16_t *test_keyword_get_input(struct comp_dev *dev);
 
int16_t test_keyword_get_input_byte(struct comp_dev *dev, uint32_t index);
int16_t test_keyword_get_input_elem(struct comp_dev *dev, uint32_t index);
int test_keyword_set_input_elem(struct comp_dev *dev, uint32_t index, int16_t val);
 
size_t test_keyword_get_input_size(struct comp_dev *dev);
void test_keyword_set_input_size(struct comp_dev *dev, size_t input_size);
#endif
 
uint32_t test_keyword_get_drain_req(struct comp_dev *dev);
void test_keyword_set_drain_req(struct comp_dev *dev, uint32_t drain_req);
 
void detect_test_notify(const struct comp_dev *dev);

#define SOF_DETECT_TEST_MAX_CFG_SIZE sizeof(struct sof_detect_test_config)
 
#endif /* __USER_DETECT_TEST_H__ */